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KLA / FILMETRICS F80
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Filmetrics F80 is a high-speed, small-spot, hyperspectral-imaging film thickness measurement instrument. It performs measurements on patterned wafers up to 200mm in diameter. The hyperspectral imaging system utilizes a revolutionary pattern recognition technique that can distinguish regions in the field of view based on their film stack, composition, and thickness.
    文件
    文件图标

    F80.mov

    KLA / FILMETRICS

    F80

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证： 60 多天前

    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    76659

    晶圆尺寸：

    8"/200mm, 12"/300mm

    年份：

    未知

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    KLA / FILMETRICS F80

    KLA / FILMETRICS

    F80

    Metrology
    年份： 0状况： 二手
    上次验证60 多天前

    KLA / FILMETRICS

    F80

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证： 60 多天前
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/4cf5e99ef87e462ba0fc1c0f3d61093c_125f6b83f03744968f806fee105c9d9b1201a_mw.jpeg
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/005d06d1afd841d5a8e69f49c5135245_82791d5ec11541b9a5c18231cd77b88f1201a_mw.jpeg
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/dffc795321c84a849fe8cbbc7de6449a_c6a49f054ace49aea5bb9320fc621e391201a_mw.jpeg
    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    76659

    晶圆尺寸：

    8"/200mm, 12"/300mm

    年份：

    未知

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Filmetrics F80 is a high-speed, small-spot, hyperspectral-imaging film thickness measurement instrument. It performs measurements on patterned wafers up to 200mm in diameter. The hyperspectral imaging system utilizes a revolutionary pattern recognition technique that can distinguish regions in the field of view based on their film stack, composition, and thickness.
    文件
    文件图标

    F80.mov

    类似上架物品
    查看全部
    KLA / FILMETRICS F80

    KLA / FILMETRICS

    F80

    Metrology年份： 0状况： 二手上次验证： 60 多天前