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说明
无说明配置
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 型号描述
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.文件
无文件
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
106397
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / MICROSENSE
PKMRAM
类别
Metrology
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
106397
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 型号描述
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.文件
无文件