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KLA ARCHER AIM+
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
    文件
    文件图标

    KLA ARCHER AIM+.pdf

    KLA

    ARCHER AIM+

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    已验证

    类别

    Metrology
    上次验证： 60 多天前
    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    58340

    晶圆尺寸：

    12"/300mm

    年份：

    2006

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA

    ARCHER AIM+

    verified-listing-icon

    已验证

    类别

    Metrology
    上次验证： 60 多天前
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5b792dddb2854413938d1c39aacf2b4b_d94b1bd8a5ef4f8d82d52a082b6fe7eb1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/7c12efc3f1ac4f34880e9181b44ce934_b80c21c9cfa64194a0d7e1285e27d1cd1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/4f0bbd1b0d664e2983e2a0ccaad53355_a8cadfeb0c184de1ab35badfa58198e01201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5fdf2e2d74c84ef98310395882061a31_b2ef839e4d094fe2a68c2f6c23ee94951201a_mw.jpeg
    物品主要详细信息
    状况：

    Used

    运行状况:

    未知

    产品编号：

    58340

    晶圆尺寸：

    12"/300mm

    年份：

    2006

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
    文件
    文件图标

    KLA ARCHER AIM+.pdf

    类似上架物品
    查看全部
    KLA ARCHER AIM+
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    Metrology年份： 0状况： 二手上次验证： 60 多天前
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    Metrology年份： 0状况： 翻新上次验证： 60 多天前
    KLA ARCHER AIM+
    KLA
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    Metrology年份： 0状况： 翻新上次验证： 60 多天前