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6" Fab For Sale from Moov - Click Here to Learn More
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SEMILAB MCV 2500
    说明
    HG-CV System for EPI resistivity measurement
    配置
    无配置
    OEM 型号描述
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    文件

    无文件

    SEMILAB

    MCV 2500

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115098


    晶圆尺寸:

    12"/300mm


    年份:

    2010


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    Metrology
    年份: 2010状况: 二手
    上次验证30 多天前

    SEMILAB

    MCV 2500

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 30 多天前
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/20b33548b90f46b5b60d7e6d933a8f04_30000_mw.jpg
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/1b51caf0b1df4f8ba9789b13ceff6386_10000_mw.jpg
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/bad0280d2b1147409ccde16b9b40dddb_20000_mw.jpg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115098


    晶圆尺寸:

    12"/300mm


    年份:

    2010


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    HG-CV System for EPI resistivity measurement
    配置
    无配置
    OEM 型号描述
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    文件

    无文件

    类似上架物品
    查看全部
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    Metrology年份: 2010状况: 二手上次验证:30 多天前
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    Metrology年份: 2010状况: 翻新上次验证:60 多天前