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SSM 5200
    说明
    Automatic CV System for CV/QV/IV measurement
    配置
    无配置
    OEM 型号描述
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    文件

    无文件

    SSM

    5200

    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115106


    晶圆尺寸:

    8"/200mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    SSM 5200

    SSM

    5200

    Metrology
    年份: 1997状况: 二手
    上次验证60 多天前

    SSM

    5200

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 30 多天前
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/54cf81f64b904a789cb2c20815f57373_1a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/957e957f2ffa46f5b36146f22b0b4c97_2a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/0de57d9c06974b2aae2001909a4b4901_1c_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/124fda7fa3c4437d9838a8e8616cc10c_1b_mw.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115106


    晶圆尺寸:

    8"/200mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Automatic CV System for CV/QV/IV measurement
    配置
    无配置
    OEM 型号描述
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    文件

    无文件

    类似上架物品
    查看全部
    SSM 5200

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    SSM 5200

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