说明
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.配置
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM 型号描述
未提供文件
无文件
类别
Overlay
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled / Crated
产品编号：
132024
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ASML
YieldStar S-200B
类别
Overlay
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled / Crated
产品编号：
132024
晶圆尺寸：
12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.配置
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM 型号描述
未提供文件
无文件