说明
Overlay Measurement System配置
无配置OEM 型号描述
The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.文件
无文件
类别
Overlay
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147631
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ASML
YieldStar 1375F
类别
Overlay
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147631
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Overlay Measurement System配置
无配置OEM 型号描述
The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.文件
无文件