说明
Optical excitation measurement system配置
无配置OEM 型号描述
The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.文件
无文件
ONTO / NANOMETRICS / ACCENT / BIO-RAD
RPM2000
已验证
类别
Photoluminescence Mapper
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
108805
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
RPM2000
类别
Photoluminescence Mapper
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
108805
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Optical excitation measurement system配置
无配置OEM 型号描述
The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.文件
无文件