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ONTO / NANOMETRICS / ACCENT / BIO-RAD RPM2000
    说明
    Photoluminescence Mapper
    配置
    无配置
    OEM 型号描述
    The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.
    文件

    无文件

    类别
    Photoluminescence Mapper

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Parts Tool


    运行状况:

    Deinstalled / Uncrated


    产品编号:

    100695


    晶圆尺寸:

    未知


    年份:

    2003


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    RPM2000

    verified-listing-icon
    已验证
    类别
    Photoluminescence Mapper
    上次验证: 60 多天前
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/cca1b6b63ac94981a121028dbc791441_nanometricsrpm20005a_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/f89a01a2d7e24e4fb64563168a6e8a03_nanometricsrpm20002a_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/d62631ae48654136a1e140ff35e9aab8_nanometricsrpm20004a_mw.jpg
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    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/71045c7fba06483180465b7c1e6f8935_nanometricsrpm2000insidephotos5_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/fbd23e03bf904c0e9e823738f7e13bb8_nanometricsrpm2000insidephotos4_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/8eba3e0f087f45eeb217ea4f26b915f1_nanometricsrpm2000insidephotos3_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/3a454819742942688f9ec7756f75ad9e_nanometricsrpm2000insidephotos2_mw.jpg
    listing-photo-52c189ebd107403c8b75a4b870710938-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74764/52c189ebd107403c8b75a4b870710938/fb4bbf19d40e4f70bf11f19bd9376923_nanometricsrpm2000insidephotos1_mw.jpg
    物品主要详细信息

    状况:

    Parts Tool


    运行状况:

    Deinstalled / Uncrated


    产品编号:

    100695


    晶圆尺寸:

    未知


    年份:

    2003


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Photoluminescence Mapper
    配置
    无配置
    OEM 型号描述
    The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.
    文件

    无文件