We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多
说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift配置
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
无文件
PREFERRED
SELLER
类别
Probers
上次验证： 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103892
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部
PREFERRED
SELLER
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
类别
Probers
上次验证： 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103892
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift配置
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
无文件