说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift配置
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
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FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
已验证
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103892
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
类别
Probers
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103892
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift配置
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
无文件