说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS: - Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) - Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Au) with FemtoGuard(TM) shielding - System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software. Microscope: Compound microscope, includes 10X eyepieces and (qty 1 ea) MPlan APO 2X, 10X, and 20X objective lens. Additional microscope lenses are sold separately. High Stability Optics Bridge Mount: 2 inch X and Y axis travel (+/- 1 inch from center), pneumatic tilt-back Z lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Probe Positioners: We have a limited supply of RF and DC probe positioners in stock, please call for details. Additional Microscope Objective Lenses: Please inquire about additional objective lens magnifications in stock Vibration Isolation Table: Vib-Iso table as shown in photos is an optional accessory that is sold separately and subject to availability at the time of order. We have several different models in stock, please inquire.配置
无配置OEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
无文件
类别
Probers
上次验证： 29 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
125826
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
类别
Probers
上次验证： 29 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
125826
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS: - Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) - Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Au) with FemtoGuard(TM) shielding - System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software. Microscope: Compound microscope, includes 10X eyepieces and (qty 1 ea) MPlan APO 2X, 10X, and 20X objective lens. Additional microscope lenses are sold separately. High Stability Optics Bridge Mount: 2 inch X and Y axis travel (+/- 1 inch from center), pneumatic tilt-back Z lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Probe Positioners: We have a limited supply of RF and DC probe positioners in stock, please call for details. Additional Microscope Objective Lenses: Please inquire about additional objective lens magnifications in stock Vibration Isolation Table: Vib-Iso table as shown in photos is an optional accessory that is sold separately and subject to availability at the time of order. We have several different models in stock, please inquire.配置
无配置OEM 型号描述
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文件
无文件