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KLA P-10
    说明
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    配置
    无配置
    OEM 型号描述
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    文件

    无文件

    KLA

    P-10

    verified-listing-icon

    已验证

    类别
    Profiler

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    64809


    晶圆尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA P-10

    KLA

    P-10

    Profiler
    年份: 0状况: 翻新
    上次验证60 多天前

    KLA

    P-10

    verified-listing-icon
    已验证
    类别
    Profiler
    上次验证: 60 多天前
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    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    64809


    晶圆尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    配置
    无配置
    OEM 型号描述
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    文件

    无文件

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    查看全部
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