说明
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included配置
无配置OEM 型号描述
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.文件
无文件
KLA
P-6
类别
Profiler
上次验证： 2 天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
140006
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included配置
无配置OEM 型号描述
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.文件
无文件