说明
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°配置
Scanning electron microscope with EDX detectorOEM 型号描述
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.文件
无文件
类似上架物品
查看全部
HITACHI
S-4500
类别
SEM / FIB
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
127176
晶圆尺寸：
未知
年份：
1993
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°配置
Scanning electron microscope with EDX detectorOEM 型号描述
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.文件
无文件