说明
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°配置
无配置OEM 型号描述
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.文件
无文件
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HITACHI
S-4500
类别
SEM / FIB
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
114675
晶圆尺寸：
未知
年份：
1995
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°配置
无配置OEM 型号描述
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.文件
无文件