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HITACHI S-4700 II
    说明
    INCLUDES CENTAURUS DETECTOR, IBSS GROUP CV10X-DS ASHER RONTEC, XFLASH DETECTOR.
    配置
    无配置
    OEM 型号描述
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    文件

    无文件

    verified-listing-icon

    已验证

    类别
    SEM / FIB

    上次验证: 4 天前

    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    138442


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    HITACHI S-4700 II

    HITACHI

    S-4700 II

    SEM / FIB
    年份: 0状况: 翻新
    上次验证4 天前

    HITACHI

    S-4700 II

    verified-listing-icon
    已验证
    类别
    SEM / FIB
    上次验证: 4 天前
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    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    138442


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    INCLUDES CENTAURUS DETECTOR, IBSS GROUP CV10X-DS ASHER RONTEC, XFLASH DETECTOR.
    配置
    无配置
    OEM 型号描述
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    文件

    无文件

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    查看全部
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