说明
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.配置
无配置OEM 型号描述
未提供文件
无文件
JEOL
JSM 7000F
类别
SEM / FIB
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
134592
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.配置
无配置OEM 型号描述
未提供文件
无文件