说明
无说明配置
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM 型号描述
未提供文件
无文件
JEOL
JSM 7000F
已验证
类别
SEM / FIB
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117400
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM 7000F
类别
SEM / FIB
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117400
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM 型号描述
未提供文件
无文件