说明
SCANNING ELECTRON MICROSCOPE配置
无配置OEM 型号描述
Multi Vision Metrology Scanning Electron Microscope In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.文件
无文件
ADVANTEST
E3630
已验证
类别
SEM
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
79946
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
E3630
类别
SEM
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
79946
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
SCANNING ELECTRON MICROSCOPE配置
无配置OEM 型号描述
Multi Vision Metrology Scanning Electron Microscope In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.文件
无文件