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HITACHI S-4700 I
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
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    HITACHI

    S-4700 I

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    104040


    晶圆尺寸:

    未知


    年份:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEM
    年份: 2001状况: 二手
    上次验证60 多天前

    HITACHI

    S-4700 I

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 60 多天前
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/6667bce67b8a4ef6baff8431891dad6c_140fd0d9208a48bd919a19e736ca60511201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/316df38601b94b56924986c3a6346ab0_156c2b3162e54c3296ec7af9736bb3c11201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/b09e1a8e27f446fc86e022d0f3992319_fcb6f3398b064dc9a056f244131966211201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    104040


    晶圆尺寸:

    未知


    年份:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
    文件

    无文件

    类似上架物品
    查看全部
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEM年份: 2001状况: 二手上次验证:60 多天前
    HITACHI S-4700 I

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    S-4700 I

    SEM年份: 0状况: 二手上次验证:60 多天前
    HITACHI S-4700 I

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    S-4700 I

    SEM年份: 2011状况: 二手上次验证:60 多天前