说明
SEM配置
JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)OEM 型号描述
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.文件
无文件
JEOL
JSM-6510LV
已验证
类别
SEM
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116074
晶圆尺寸：
未知
年份：
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-6510LV
类别
SEM
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116074
晶圆尺寸：
未知
年份：
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
SEM配置
JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)OEM 型号描述
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.文件
无文件