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6" Fab For Sale from Moov - Click Here to Learn More
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JEOL JSM-7600F
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The JSM-7600F is a state-of-the-art Scanning Electron Microscope (SEM) that combines ultra-high-resolution imaging with enhanced analytical capabilities. It boasts a resolution of 1.5 nm at 1 kV in GB mode and 1.0 nm at 15 kV, with an accelerating voltage ranging from 0.1 kV to 30 kV. The microscope offers a magnification range from 25x to 1,000,000x, providing ultra-high-resolution imaging comparable to cold FEG SEM. This SEM is equipped with an in-lens thermal FE gun and an aperture angle control lens, ensuring optimum beam projection regardless of the probe current level. It also offers robust analytical capabilities at a maximum probe current of 200 nA at 15 kV, supporting various types of sample analysis such as WDS and EDC. The JSM-7600F features an r-filter for controlling the energy selection and image mixture rate for secondary electron and backscattered electron images. Its Gentle Beam mode minimizes beam damage for ultra-surface imaging. Designed with energy efficiency and environmental friendliness in mind, this powerful FE-SEM is a valuable tool for any laboratory.
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    JEOL

    JSM-7600F

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    48112


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    JEOL JSM-7600F

    JEOL

    JSM-7600F

    SEM
    年份: 0状况: 二手
    上次验证60 多天前

    JEOL

    JSM-7600F

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 60 多天前
    listing-photo-ff4a115ef8914cbc9aca05dffef6f7a2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    48112


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The JSM-7600F is a state-of-the-art Scanning Electron Microscope (SEM) that combines ultra-high-resolution imaging with enhanced analytical capabilities. It boasts a resolution of 1.5 nm at 1 kV in GB mode and 1.0 nm at 15 kV, with an accelerating voltage ranging from 0.1 kV to 30 kV. The microscope offers a magnification range from 25x to 1,000,000x, providing ultra-high-resolution imaging comparable to cold FEG SEM. This SEM is equipped with an in-lens thermal FE gun and an aperture angle control lens, ensuring optimum beam projection regardless of the probe current level. It also offers robust analytical capabilities at a maximum probe current of 200 nA at 15 kV, supporting various types of sample analysis such as WDS and EDC. The JSM-7600F features an r-filter for controlling the energy selection and image mixture rate for secondary electron and backscattered electron images. Its Gentle Beam mode minimizes beam damage for ultra-surface imaging. Designed with energy efficiency and environmental friendliness in mind, this powerful FE-SEM is a valuable tool for any laboratory.
    文件

    无文件

    类似上架物品
    查看全部
    JEOL JSM-7600F

    JEOL

    JSM-7600F

    SEM年份: 0状况: 二手上次验证:60 多天前
    JEOL JSM-7600F

    JEOL

    JSM-7600F

    SEM年份: 0状况: 二手上次验证:60 多天前