说明
无说明配置
无配置OEM 型号描述
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 12 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
152750
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / ADE
ULTRASCAN 9600
类别
Thin Film / Film Thickness
上次验证： 12 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
152750
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.文件
无文件