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说明
无说明配置
Measurement Range : 25- 20 - 500-200 um with the visible light source (400 to 800nm halogen lamp) - 25- 500 with UV light source (210 - 400nm Deuterium lamp). Linear Array Head Automated focusing Joystick-automated stage with twin chuck ( 8inch, 6inch) CV -S3200 CCD Camera Objectives (Auto revolver) : Olympus 4X, 10X, 15X 2D and 3D wafer-mapping software S/W Version : 1.63, OS : Windows 2000OEM 型号描述
The NanoSpec 6100 is a tabletop film analysis system that provides fast and low-cost measurement capabilities for thin film metrology. It uses non-contact spectroscopic reflectometry to measure sites as small as 10µm in diameter on production wafers and can measure wafer substrates in the size range of 75 to 200mm and photomasks from 5 to 9 inches square. The system can measure film thickness in the range of 200Å - 20µm with the visible light source and 25Å - 20µm with an optional UV light source. The upper thickness range can be extended to 70µm with the thick film option. The system also has a motorized, precision x-y sample stage with a resolution of better than 1µm and a high-resolution color graphics display that provides contour and 3D film thickness mapping.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
102006
晶圆尺寸：
8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 6100
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
102006
晶圆尺寸：
8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Measurement Range : 25- 20 - 500-200 um with the visible light source (400 to 800nm halogen lamp) - 25- 500 with UV light source (210 - 400nm Deuterium lamp). Linear Array Head Automated focusing Joystick-automated stage with twin chuck ( 8inch, 6inch) CV -S3200 CCD Camera Objectives (Auto revolver) : Olympus 4X, 10X, 15X 2D and 3D wafer-mapping software S/W Version : 1.63, OS : Windows 2000OEM 型号描述
The NanoSpec 6100 is a tabletop film analysis system that provides fast and low-cost measurement capabilities for thin film metrology. It uses non-contact spectroscopic reflectometry to measure sites as small as 10µm in diameter on production wafers and can measure wafer substrates in the size range of 75 to 200mm and photomasks from 5 to 9 inches square. The system can measure film thickness in the range of 200Å - 20µm with the visible light source and 25Å - 20µm with an optional UV light source. The upper thickness range can be extended to 70µm with the thick film option. The system also has a motorized, precision x-y sample stage with a resolution of better than 1µm and a high-resolution color graphics display that provides contour and 3D film thickness mapping.文件
无文件