说明
Film Thickness Monitor with JA Woolham Ellipsometer, for up to 300mm Open Cassettes配置
无配置OEM 型号描述
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文件
无文件
类别
Thin Film / Film Thickness
上次验证： 9 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153547
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300XSE
类别
Thin Film / Film Thickness
上次验证： 9 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153547
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Film Thickness Monitor with JA Woolham Ellipsometer, for up to 300mm Open Cassettes配置
无配置OEM 型号描述
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文件
无文件