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KLA UV-1250SE
  • KLA UV-1250SE
  • KLA UV-1250SE
  • KLA UV-1250SE
说明
无说明
配置
无配置
OEM 型号描述
The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
文件

无文件

PREFERRED
 
SELLER
verified-listing-icon

已验证

类别
Thin Film / Film Thickness

上次验证: 60 多天前

Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

98346


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

UV-1250SE

verified-listing-icon
已验证
类别
Thin Film / Film Thickness
上次验证: 60 多天前
listing-photo-2368532cf50f4a5787fb95543fa5639e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

98346


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
无配置
OEM 型号描述
The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
文件

无文件