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KLA UV-1250SE
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
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    verified-listing-icon

    已验证

    类别
    Thin Film / Film Thickness

    上次验证: 13 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    147940


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA UV-1250SE

    KLA

    UV-1250SE

    Thin Film / Film Thickness
    年份: 0状况: 二手
    上次验证18 天前

    KLA

    UV-1250SE

    verified-listing-icon
    已验证
    类别
    Thin Film / Film Thickness
    上次验证: 13 天前
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/e047a275d58a493186cacdc25039ff7e_whatsappimage20260606at08_mw.jpeg
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/b26684604a8e47c1a08ee89a97ba3924_whatsappimage20260606at08_mw.jpeg
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/d3272e7d734e4d51a03a5821a9027ef9_whatsappimage20260606at08_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    147940


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
    文件

    无文件

    类似上架物品
    查看全部
    KLA UV-1250SE

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    KLA UV-1250SE

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    UV-1250SE

    Thin Film / Film Thickness年份: 0状况: 二手上次验证:13 天前
    KLA UV-1250SE

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    Thin Film / Film Thickness年份: 0状况: 二手上次验证:60 多天前