说明
无说明配置
Metal Thickness MeasurementOEM 型号描述
MetaPULSE-III 300 is designed specifically to meet semiconductor manufacturers' metal thin-film metrology requirements at the 45 nm technology node and beyond. The modular design of the MetaPULSE-III offers Rudolph's patented PULSE Technology.文件
无文件
ONTO / RUDOLPH / AUGUST
MetaPULSE-III 300
已验证
类别
Thin Film / Film Thickness
上次验证： 30 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116998
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / RUDOLPH / AUGUST
MetaPULSE-III 300
类别
Thin Film / Film Thickness
上次验证： 30 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
116998
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Metal Thickness MeasurementOEM 型号描述
MetaPULSE-III 300 is designed specifically to meet semiconductor manufacturers' metal thin-film metrology requirements at the 45 nm technology node and beyond. The modular design of the MetaPULSE-III offers Rudolph's patented PULSE Technology.文件
无文件