Cohu acquires Xcerra, adding LTX-Credence Testers, Multitest test handlers and contactors and Everett Charles Technology (ECT) pogo spring probes to the portfolio.

The LTX-Credence ASL 1000, introduced in fiscal 1996, is a highly configurable test system designed for testing traditional analog building block integrated circuits (ICs). Its versatility allows it to adapt to the evolving needs of analog and linear device manufacturers as they transition to more efficient manufacturing processes. 

COHU / LTX-CREDENCE

ASL 1000

PAx is available in flexible RF configurations for single or multisite testing. PAx is the only cost-optimized ATE solution that covers all 8.5 GHz standards with instrument extension to 18 GHz with high power.

The LTX-Credence Diamondx Tester is a versatile and air-cooled platform designed to efficiently test the complete signal chain, covering power, RF, and MCU (Microcontroller Unit) devices. It offers a universal testing capability, enabling comprehensive assessments of different types of semiconductor devices without unnecessary platform overhead.

DIAMONDx

Introduced in fiscal 2002, the ASL 3000 is an extension of the ASL product line featuring an increased number of mixed signal instruments, expansion to 64 pins of digital capability, and DSP based mixed signal test. The ASL 3000 is capable of testing more complex devices and more devices in parallel and targets a wide range of ICs used in personal communications.

ASL 3000

The Fusion CX is a high-performance, lower cost Fusion system targeted primarily towards the testing of high-volume mixed signal devices. The mixed signal device technologies tested by Fusion CX are often the precursor to mixed signal technologies that will be incorporated into next generation SOC designs. Because Fusion CX uses the same enVision++ development software as Fusion HF, customers are able to upgrade their test capability to Fusion HF as the complexity of their next generation SOC devices require. The Fusion CX features up to 128 digital pins, mixed signal and RF test instruments, and power management test technology. Typical device types tested on Fusion CX include radio frequency/wireless such as 802.11b and power management.

FUSION CX

The LTX-Credence Fusion MX is a versatile mid-range testing system designed to cater to applications in the Automotive, Power Management, Wireless RF, and Consumer Baseband industries. It offers twice the number of instruments compared to the Fusion CX, providing increased testing capabilities. The Fusion MX utilizes the same instrument cards available in DX, CX, and EX products, as it is built on a universal slot system architecture. This allows it to be configured with up to 256 digital pins while accommodating various mixed signal instruments available in other X-Series configurations. Additionally, the Fusion MX can run the same test programs developed for other X-Series systems, thanks to the common Envision operating system used across the platform.

FUSION MX

The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.

DIAMOND 10

Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.

SAPPHIRE

Introduced in early 2002 and first shipped in May 2002, the ASL 3000RF extends the ASL 3000 product line by incorporating proprietary MVNA technology to test RF devices. The ASL 3000RF is targeted at cost effective testing of RF front-end devices that are typically manufactured using Gallium Arsenide, or GaAs, Bi-polar or Bi-CMOS technology. The devices, Power Amplifiers, or PAs, Low Noise Amplifiers, or LNAs, Synthesizers, Mixers and Switches and integrated combinations of these, or Base band chips, are used in both digital and analog cell phones. Providing capability to test devices compliant with Bluetooth and 802.11 standards, the ASL 3000RF delivers high performance, high throughput and leading cost of test economics.

ASL 3000RF

The LTX-Credence TS88 is the advanced successor to the TS80, serving as the master test station in the LTX 77/90 modular test system. Building on the capabilities of the TS80, the TS88 offers enhanced flexibility and performance to cater to the growing demands of semiconductor testing. 

TS88

Introduced in fiscal 1999, the Kalos (hex) is based upon the Kalos tester. The Kalos (hex) features 16 test sites, enabling testing of high pin count NVM and flash memory core microcontroller devices.

KALOS hex

Quartet was introduced in 1998 and started shipping in early fiscal 1999. Quartet builds on the Duo series by addressing the needs of device manufacturers serving the consumer mixed-signal, or CMS, marketplace. CMS devices combine the power of digital processors with CD quality audio, broadcast video and wireless communications onto a single, cost-sensitive SoC. The Quartet, the first of the Quartet series, addresses all four of these requirements in an integrated, ready for volume production package. With 200 MHz digital, 20 bit audio and 300 MHz video, Quartet is designed to meet the demands of the most complex SoC devices. In fiscal 2004, as part of the integration of the NPTest business, we communicated to customers that future SoC research and development would be focused on the Sapphire platform.

QUARTET

The TS88 succeeds the TS 80 as the master test station in the LTX 77/90 modular test system. The TS88 has all the capabilities of the TS80, but offers more flexibility and performance to meet the expanding needs of semiconductor testing.

TS80

The Fusion High Functionality ("HF") test head contains high pin count digital and mixed signal technology to test all aspects of a system-on-a-chip device in a single insertion. The HF test head contains 32 mixed signal slots, 64 HiPer II digital pin slots and 8 radio frequency ("RF") or power module slots, thus enabling it to test both digital and analog signals.  The HF test head can be
configured with up to 1,024 digital pins. The HF can support a wide range of mixed signal test solutions such as RF, smart power, precision high voltage analog channels, precise timebase analyzers, powerful DSP-based synthesizer and digitizers for high-speed and high-resolution embedded converters.


FUSION HF

200 Mbps with 96 channels per card. 16 channels at 2A each, 4 quadrant. Audio, video instruments. Compact, scalable, air cooled. Optimized multi-site test architecture. 
Introduced in fiscal 2005, the Sapphire D extends the key attributes of the Sapphire into a cost effective test platform addressing the more cost driven markets such as personal consumer devices, micro-controllers, digital-baseband and display driver technologies. The Sapphire D architecture is highly configurable and focused on extending scalability into massive multi-site testing, which results in a superior cost of test model for our customers. The Sapphire D leverages electronics integration and air-cooling to produce a compact form factor. The Sapphire D is used for engineering as well as wafer sort and final production testing. Sapphire D initial introductory instruments are the DPIN 96 (96 channels at 200 Mbps) and mixed-signal instruments for video and audio testing. Initial Sapphire D production test systems have been shipped, installed and accepted.

SAPPHIRE D-10

The ASL Platform provides a wide range of production proven resources dedicated to providing the best test solutions for cost sensitive linear and low complexity mixed signal devices. The ASLx Test System expands the standard resources of the ASL platform with a variety of dedicated instruments.

ASLx

QUARTET ONE

SYNCHROMASTER

Fusion EX offers four times the instrument channels as Fusion CX, enabling a wider range of system configurations Fusion EX uses existing Fusion platform instruments to address the testing needs of advanced consumer digital and baseband communications devices. These instruments contain a smaller number of instrument channels in each card, which allows for small configuration increments. This, combined with Fusion’s universal slot design, produces system configurations with a more efficient cost of ownership than competitive platforms.

FUSION EX

Introduced in fiscal 2000, the Kalos xw is based upon the Kalos tester and features twice as many test sites as the Kalos or the Kalos xp, 32 or 16, respectively.

KALOS xw

In 1997 the Company expanded the SC series by introducing and shipping the SC 312, which runs at a higher speed (100 MHz) and has improved accuracy over the SC 212.

SC 312

PAX-AC

The LTX-Credence Fusion HT is a high-throughput test system specifically designed for efficiently testing complex mixed signal devices. With up to 48 digital and 48 analog pins, it incorporates RF test instruments and smart power test technology. The Fusion HT is well-suited for testing a wide range of device types, including RF/wireless, smart power, and consumer video and audio applications. Powered by enVision++, it offers seamless compatibility with the Synchro HT platform, ensuring streamlined and reliable testing processes. Overall, the Fusion HT enables rapid and accurate testing of intricate mixed signal devices with high throughput capabilities.

FUSION HT

The LX system builds on the success of the company's award winning desktop DX system offering more instrument slots, a direct loadboard interface and comprehensive production capabilities while still maintaining a compact configuration that does not require a mainframe. This makes the LX ideal for both high volume production and engineering characterization. It offers 20 instrument slots, 128 digital pins, and the X-Series' full range of DSP, DC and power capabilities.

FUSION LX

The configuration of the Synchro II test system is flexible. This permits LTX customers to choose from a wide array of options to meet the test requirements of a broad range of linear/mixed signal devices.

SYNCHRO II

 FUSION MxC

The VALSTAR 2000 was introduced in 1997 and the Company believes it is the first system designed specifically with the performance cost structure for volume production of high pin count VLSI devices. This product offers up to 1,024 input/output (I/O) pins at 200 MHz data rates, and requires less than four square meters of floor space. A fully loaded system consumes only 16 kilowatts of power, which is generally less than many competitive systems, thus lowering operating costs.

VS2000

The Duo SE and the Duo SX are recent additions to the Duo product family which run at 50 MHz and 200 MHz, respectively. These systems allow customers to choose the level of technology and cost structure that best meet their needs. The Duo SE and SX are fully compatible with other members of the Duo family and supports the same set of mixed signal instrumentation.

DUO-SX

The Fusion HT and Fusion AC test systems are designed for high throughput testing of complex mixed signal devices. The Fusion AC features up to 96 digital and 96 analog pins and high-speed DSP instruments. Typical device types tested on the Fusion AC include high-speed local area networks ("LAN"), disk drive, and data communications.  The Fusion AC is also powered by enVision++, and is fully compatible with the Synchro AC.


FUSION AC

 The IDS P3X is a Focused Ion Beam product used for circuit edit and repair. The IDS P3X combines ion column with a CAD navigation interface, which enables the user to align FIB and CAD images simultaneously. In failure analysis, the IDS P3X can identify and repair circuit layout mainly in outer metal layers. The system can provide an option to edit 300mm wafers.

IDS P3X

An industry-leading solution for backside timing measurement of flip-chip packaged and complex multi-metal layer devices, the EmiScope-I provides interactive tools to perform transistor level timing measurements in the engineering, debug and failure analysis environments. Using innovative time-resolved emission technology, the system enables semiconductor manufacturers to bring products to market faster, at a lower cost, and accelerate failure analysis problem resolution.

EMISCOPE-I

DVI300

Personal Kalos is a desktop engineering version of the high-throughput Kalos tester.

Personal KALOS

The EmiScope-I-GP extends time-resolved emission capability to devices packaged with wire bond and tape automated bonding technologies. Featuring a long working distance objective to accommodate the needs of traditional packaging, the system enables probing in a variety of load board and package configurations.

EMISCOPE-I-GP

The Electra system can send and receive data from ICs under test at up to 200 MHz. Our Electra series includes the Electra, which can test mixed-signal ICs with up to 224 pins, and the Electra MX, which can test mixed-signal ICs with up to 576 pins.

IMS ELECTRA MX

The STS 3500 mixed-signal tester currently offered by the Company evolved from predecessor mixed-signal testers that were introduced by Axiom, a mixed-signal tester manufacturer acquired by the Company in 1988.

STS 3500

The Logic100 was introduced bythe Company in 1994 and is the 100 Mhz version of the VistaLOGIC. The VistaLOGIC and Logic100 incorporate one of the Company's proprietary CMOS stabilization methods.

LOGIC 100

The VistaLOGIC was introduced by the Company in 1993 and evolved from its predecessor, the Vista LT. The VistaLOGIC and Logic100 incorporate one of the Company's proprietary CMOS stabilization methods.

VistaLOGIC

The LTX-Credence Personal Kalos 2 (PK2) is a desktop engineering version of the high-throughput Kalos tester. It was introduced in fiscal year 2003 and offers a compact and efficient solution for engineering and testing purposes. As a desktop version of the Kalos tester, the PK2 provides engineers with convenient access to testing capabilities, making it easier to evaluate and troubleshoot integrated circuit devices in a lab or engineering environment.

Personal KALOS 2

 The Synchro ProductionPAC test systems are lower cost, smaller footprint, specifically focused configurations that address the
production requirements of high volume, low cost mixed signal devices. The RFPAC system is configured to test devices used in the rapidly expanding wireless communications market. The PowerPAC addresses "smart" power devices that are being increasingly used in automobiles and consumer electronics. The TelePAC addresses commodity ICs used in telecommunications. The ConverterPAC is focused on devices used in multimedia applications.

SYNCHRO ProductionPAC

PANTHER is a prober that optimizes test and vision inspection of wafer level package (WLP) and bumped dies, delivering a substantial improvement in semiconductor manufacturing quality that is required for today’s high-end consumer products.

PANTHER

The Duo is the 100 MHz version of the VistaVISION and was introduced by the Company in 1994. The VistaVISION and the DUO incorporate one of the Company's proprietary CMOS stabilization methods.

 The IDS OptiFIB is a Focused Ion Beam product used for circuit edit and repair. The IDS OptiFIB is unique because it combines ion and photon optics in a single coaxial column with a CAD navigation interface, which enables the user to align FIB and CAD images simultaneously, increasing the accuracy of circuit modification. In failure analysis, the IDS OptiFIB can identify and repair circuit layout at inner metal layers. The system can provide option to edit 300mm wafers.

IDS OptiFIB

EPRO  The Company's EPRO product line includes the model 142/AX and EDGE testers. The model 142/AX was first shipped by EPRO in 1982. The EDGE is the follow-on version of the model 142/AX with additional testing sites.

EPRO 142/AX

A configurable, expandable platform for non-invasive, transistor-level internal signal probing of silicon ICs. The EmiScope-IIt is the industry-leading solution for debug of flip-chip packaged and multi-metal layer devices. Using innovative time-resolved photon emission detection technology, the system enables semiconductor manufacturers to perform debug and characterization more quickly and effectively, thus bringing products to market faster, with fewer design respins. The system’s high-bandwidth electronics, high-resolution imaging, and data management capabilities enable semiconductor manufacturers to perform timely design debug, failure analysis and characterization. The EmiScope-IIt offers multiple user options, including five lens sets for a variety of package types, high-power cooling, flexible fixturing and software data analysis modules. The EmiScope-IIt can also be field upgraded with GlobalScan technology as customer needs grow.

EMISCOPE-IIt

The EXA3000, introduced in 2000, is a high performance functional test platform capable of testing a wide range of ICs. The EXA3000 provides a wide performance range from 400 MHz to 3.2 GHz, allowing the test of most SOCs, microprocessors and graphics ICs. The EXA3000 is used for characterization and final test.

EXA3000

Introduced in 1999, the Kalos xp is based upon the Kalos tester. The Kalos xp features a wider, 96 pin test site enabling testing of high pin count NVM and flash memory core microcontroller devices. Kalos xp provides up to eight site-in-parallel test capabilities in a small footprint tester package.

KALOS xp

XTS-FT	

Synchro test systems are designed for high throughput testing of linear devices and for testing of mixed signal devices that require high digital pattern rates and high digital pin counts. The Synchro features independent microprocessors that concurrently control both linear and digital resources at each pin of the IC under test. This design permits the generation of test signals and measurements on many device pins at the same time, producing faster test times on high pin count ICs.

SYNCHRO

**PARTS**

KALOS 2 hex

In 1997 Credence also added two new versions of the Duo system, the Duo LFI which tests complex, high performance audio devices, and the Duo RF, a system which combines high performance digital and radio frequency (RF) testing on the same platform.

DUO-LFI

OCTET 400

The Ninety system is an improved version of the LTX77, the Company's first linear/mixed signal test system introduced in 1977. Although the Synchro has largely superseded the Ninety, the Company continues to manufacture the Ninety for customers who are already using the Ninety or LTX77 systems and desire to expand capacity.

NINETY

The LTX-Credence Kalos 2 products are known for their exceptional parallel test capabilities, making them highly efficient in testing a large number of devices simultaneously. With a minimal footprint and comprehensive engineering to production test coverage, the Kalos 2 ensures maximum test efficiency and coverage for Non-Volatile Memory (NVM) devices. Its advanced features contribute to the lowest overall cost of test, making it a cost-effective solution for testing NVM devices in high-volume production environments.

KALOS 2

Our mixed-signal engineering validation test systems are used by customers to verify the designs of complex integrated circuits containing both digital and analog functionality. These mixed-signal integrated circuits are used in applications such as cellular phones, internet appliance, set top boxes and cable modems. The IMS Gemini MS is also used to test selected functions of highly-integrated, or system-on-chip, designs. Depending on configuration, the system can send and receive data from integrated circuits under test at up to 330 MHz.

IMS GEMINI MS

OCTET 200

The SZ Piranha is an analog and mixed-signal test system that provides a cost-effective solution for high volume devices with low and medium pin counts. The SZ Piranha uses the same hardware and software technology as the SZ Falcon in a smaller housing without a test head. With frequencies up to 50 MHz digital and up to 64 pins, the SZ Piranha also features multi-site and parallel test capabilities to lower test costs.

SZ PIRANHA

IMS ELECTRA

The SZ Falcon is a high-performance analog and mixed-signal test system that offers unique analog, DSP and digital capabilities for automotive, smart power, and consumer devices. SZ Falcon delivers high throughput with a 200 MHz digital sequencer per channel architecture, and reduces test costs through its high-speed computer/tester interface, and parallel, multi-site, and concurrent test capabilities. The SZ Falcon offers an innovative tester-per-pin technology for analog and digital applications, as well as special automotive pins offering a voltage swing up to a 30 V. The SZ Falcon also features Giglink, a new high-speed serial bus system, and AWT, a new analog wave tool.

SZ FALCON

The IDS P3X-II is the most advanced Focused Ion Beam product used for circuit edit and repair of devices that use 90nm and beyond process technology. The IDS P3X-II combines ion column with a CAD navigation interface, which enables the user to align FIB and CAD images simultaneously. In failure analysis, the IDS P3X-II can identify and repair circuit layout mainly in outer metal layers. The system can provide an option to edit 300mm wafers.

IDS P3X-II

The STS 5000 is the higher pin count version of the STS 3500.

STS 5000

This product requires approximately 30 square feet of floor space and 4 kilowatts of power for 304 pins.

SC 212

The latest system in the ValStar line up was  introduced  in 1998.  Unlike the VS2000,  the VS2000e uses a customer  specific  external  testhead  positioner.

VS2000e

Introduced in fiscal 2000, the ASL 2000 is an extension of the ASL 1000 featuring an increased number of instruments, expansion to increased digital capability, and DSP based mixed signal test. The ASL 2000 is capable of testing more complex devices and more devices in parallel and targets a wide range of ICs used in personal communications.

ASL 2000

The IMS Vanguard, our flagship engineering validation test product introduced by IMS in 1999, can send and receive data from ICs under test at up to 1 Gbs and accounted for the majority of our logic family sales in 2002 and 2003. The logic engineering validation test system family includes the Vanguard 500, 330 and 550.

VANGUARD 550

QUARTET ONE PLUS

Diamondx DxV is a self-contained unit with an embedded high-performance Linux controller running Cohu’s Unison test environment and associated tools. The ‘single box’ design and low overall weight enables true zero footprint test floor impact when docked to probe or final test material handlers.

DIAMOND DxV

The IMS Vanguard, our flagship engineering validation test product introduced by IMS in 1999, can send and receive data from ICs under test at up to 1 Gbs and accounted for the majority of our logic family sales in 2002 and 2003. The logic engineering validation test system family includes the Vanguard 500, 330 and most recently introduced 550.

VANGUARD 330

The Synchro Plus test system is configured with SuperSpeed Data Pins which can test mixed signal devices at data rates of up to 400 MHz. The Synchro Plus system addresses the test requirements of new, high speed devices used in applications such as disk drives for personal computers and advanced ATM(Asynchronous Transfer Mode) interface boards used to support the development of the information superhighway.

SYNCHRO Plus

iPTest systems are used to test discrete semiconductor components, such as diodes, small signal transistors and power transistors, as well as arrays of these components. These discrete components are used in every area of electronics. iPTest systems are also capable of accurately measuring the characteristics of transient voltage suppression components, which are widely used to protect personal computers and telecommunications products from harmful voltage spikes or surges.

iPTEST

The LTX77 is the Company's first linear/mixed signal test system introduced in 1977.

LTX77

The ATS800 product line, acquired through the acquisition of NMS, is an application of native mode test technology for testing Rambus In-line Memory Modules (RIMM). The ATS800 provides a significantly lower cost and higher quality of test compared to the competition.

ATS800

OCTET 800

Fusion HFi provides higher performance digital channels in a smaller footprint than the Fusion HF. Custom IC development has significantly reduced the component count required to implement the digital subsystem. This, coupled with state-of-the-art packaging and a new, modular integrated thermal management system, provides a reduction in board and interconnect count thereby reducing the overall footprint of the tester. The complete range of instruments developed for the Fusion HF are also available for the Fusion HFi. The Fusion HFi preserves our customers’ investments in test programs and intellectual property, loadboards, design links, factory integration, and training through compatibility with current Fusion HF configurations while providing greater digital test capabilities.

FUSION HFi

VANGUARD 500

The SC Micro is a cost reduced version of the SC 212. The SC Micro retains the customer's test quality while continuing to lower their test costs.

SC MICRO

Sapphire D-40 has four times the performance and a footprint only 25 percent larger than a single Sapphire D-10.

SAPPHIRE D-40

A configurable platform for fault and design marginality localization, the GlobalScan-I features innovative laser-scanning microscope (LSM) technology. It supports the same options as the EmiScope-IIt, including five lens sets, a common software base, and flexible fixturing and cooling options. In its fault isolation mode, the GlobalScan system quickly pinpoints resistive metal interconnections, opens and other traditional manufacturing faults, allowing manufacturers to solve critical yield problems quickly and efficiently. In its performance marginality localization mode, the GlobalScan-I identifies regions of a circuit which are limiting performance at specific speeds, voltages, or temperature conditions, allowing device designers to implement design fixes efficiently and with fewer design respins. The GlobalScan-I system can also be field upgraded to EmiScope functionality as customer needs grow.

GLOBALSCAN-I

A next-generation system for transistor-level backside analysis of complex IC designs with both flip-chip and wire bond packaging technologies. Featuring a new Solid Immersioin Lens (SIL), EmiScope-II provides an industry-leading sub-0.25 micron image resolution and enhanced data acquisition rate to enable analysis of device performance at the critical node level. The system’s high-speed acquisition and data processing capabilities enable semiconductor manufacturers to quickly perform design debug, failure analysis and characterization, improving time-to-market and lowering device development costs.

EMISCOPE-II

Fusion DX extends the reach of Fusion to the desktop, offering complete ATE capabilities and the flexibility to be deployed at any point from design to production. Fusion DX can be integrated into other production equipment, including test systems, probers or handlers without use of additional floor space, and offers a wide range of capabilities, including full-featured digital and a broad line of mixed signal instruments. This powerful instrument set has been deployed to Fusion’s installed base, including numerous systems at subcontract test providers worldwide.

FUSION DX

The IMS Orion is used by our customers to verify the designs of the most common types of memory integrated circuits, including complex SRAMs and DRAMs. The IMS Orion will send and receive data from integrated circuits under test at speeds up to 200 MHz/400 Mbs.

IMS ORION

Introduced in November 1997, the Kalos is a highly integrated, parallel system designed to test flash memory. Running at 50 MHz, it provides multi-site testing and is designed to lower the customer's cost of test. The Kalos features a unique tester-on-a-card architecture, which places all test functions for each site on a single card and thus reduces floor space and power consumption while increasing performance.

KALOS

 The Duo SE is a new low end addition to the Duo product line.  It provides a lower cost, 50 MHz version of the industry's leading Digital Mixed Signal test system family.  The Duo SE is fully compatible with other members of the Duo family and supports the same set of mixed signal instrumentation.

DUO-SE

DUO-RF

The VistaVISION, an adaptation of the VistaLOGIC, was first shipped by the Company in 1992, and has been enhanced to test both digital and mixed-signal devices.

VistaVISION

The Vista LT was first shipped by Tektronix in 1987 and was acquired by the Company in 1990.

COHU / LTX-CREDENCE

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