说明
无说明配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM 型号描述
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)文件
无文件
类似上架物品
查看全部
HITACHI
S-8840
类别
CD-SEM
上次验证： 60 多天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
131710
晶圆尺寸：
8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM 型号描述
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)文件
无文件