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KLA AIT I
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The AIT In-line Defect Inspection System is a high-throughput system that uses proprietary double-darkfield (DDF) laser scanning technology to detect defects, microscratches, and particulate contamination on wafers. It can inspect up to 30 wafers per hour at maximum sensitivity and has a low cost-per-inspection, making it economically feasible to perform in-line process monitoring at more process levels. The system achieves exceptional defect sensitivity through innovations such as a reduced laser spot size and a unique double-darkfield laser scattering design.
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    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    126907


    晶圆尺寸:

    未知


    年份:

    1998


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA

    AIT I

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 30 多天前
    listing-photo-fce5608abaf648ed93232d885812e6f8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53459/fce5608abaf648ed93232d885812e6f8/f96fd379d64d4820806a80ec51673cbe_a6254962a8aa40d6a9e805d1cb9f0a9b_mw.jpeg
    listing-photo-fce5608abaf648ed93232d885812e6f8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53459/fce5608abaf648ed93232d885812e6f8/d5e9684bfd5f4e89be83ca766e9defcc_aafc16c3105b4442b5cf21de56b0f6311201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    126907


    晶圆尺寸:

    未知


    年份:

    1998


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The AIT In-line Defect Inspection System is a high-throughput system that uses proprietary double-darkfield (DDF) laser scanning technology to detect defects, microscratches, and particulate contamination on wafers. It can inspect up to 30 wafers per hour at maximum sensitivity and has a low cost-per-inspection, making it economically feasible to perform in-line process monitoring at more process levels. The system achieves exceptional defect sensitivity through innovations such as a reduced laser spot size and a unique double-darkfield laser scattering design.
    文件

    无文件

    类似上架物品
    查看全部