说明
KLA 56G4488 CFM KLA 56G4488 CFM [CFM] DEFECT INS配置
CMP AIT2OEM 型号描述
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.文件
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KLA
AIT II
类别
Defect Inspection
上次验证： 21 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
140135
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
KLA 56G4488 CFM KLA 56G4488 CFM [CFM] DEFECT INS配置
CMP AIT2OEM 型号描述
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.文件
无文件