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KLA CANDELA CS20
    说明
    KLA-Tencor Candela CS20 *. Fully refurbished. Installed in Clean-room. Possible demo anytime.
    配置
    Working Wafer Size : 2 ~8 inch Illumination Source : 8mW laser, 635 nm wavelength Operator Interface : Trackball and keyboard standard Substrate Thickness : 350 μm ~ 1,100 μm Substrate Material : Any clear or opaque polished surface [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) Other Defects and Applications : Particles, scratches, stains, pits, and bumps. Sensitivity: Minimum detectable size for automatic defect classification: - Scratches: 100 μm long, 0.1 μm wide, 50 Å; deep. - Pits: 20 μm diameter, 50 Å; deep - Stains: 20 μm diameter, 10 Å; thick [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (SiC, GaN, Sapphire)
    OEM 型号描述
    The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
    文件

    无文件

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    65980


    晶圆尺寸:

    6"/150mm


    年份:

    2006


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA

    CANDELA CS20

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/ca17fec94aaa481aa272fe22a56fbc40_1_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/d87b262c1ffe4fa59c6dd761f202781d_5_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/a612fdebe178436296e717bdee94ccd4_4_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/fcf9a358237e4fdcba205e6bc362f19c_6_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/4d5d4d59bd864ffebd82b190e88846a7_8_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/621343908a1f4e44990dec823b2783c2_3_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/91a9a843566944329618c5e6d74fec85_2_mw.jpg
    listing-photo-0ca012a6b7b64a4b8d0d023c09f340c2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/0ca012a6b7b64a4b8d0d023c09f340c2/29dc1a5e3db9479e8ba71b42e64518ab_7_mw.jpg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    65980


    晶圆尺寸:

    6"/150mm


    年份:

    2006


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    KLA-Tencor Candela CS20 *. Fully refurbished. Installed in Clean-room. Possible demo anytime.
    配置
    Working Wafer Size : 2 ~8 inch Illumination Source : 8mW laser, 635 nm wavelength Operator Interface : Trackball and keyboard standard Substrate Thickness : 350 μm ~ 1,100 μm Substrate Material : Any clear or opaque polished surface [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) Other Defects and Applications : Particles, scratches, stains, pits, and bumps. Sensitivity: Minimum detectable size for automatic defect classification: - Scratches: 100 μm long, 0.1 μm wide, 50 Å; deep. - Pits: 20 μm diameter, 50 Å; deep - Stains: 20 μm diameter, 10 Å; thick [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (SiC, GaN, Sapphire)
    OEM 型号描述
    The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
    文件

    无文件