说明
Optical Defect Inspection配置
无配置OEM 型号描述
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).文件
无文件
KLA
CANDELA CS20
已验证
类别
Defect Inspection
上次验证： 10 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
115117
晶圆尺寸：
6"/150mm
年份：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部
KLA
CANDELA CS20
类别
Defect Inspection
上次验证： 10 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
115117
晶圆尺寸：
6"/150mm
年份：
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Optical Defect Inspection配置
无配置OEM 型号描述
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).文件
无文件