We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多
说明
Wafer defect detection配置
无配置OEM 型号描述
The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.文件
无文件
类似上架物品
查看全部
KLA
2135
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
110360
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer defect detection配置
无配置OEM 型号描述
The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.文件
无文件