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KLA 2135
    说明
    无说明
    配置
    MS-DOS
    OEM 型号描述
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
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    KLA

    2135

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    89654


    晶圆尺寸:

    未知


    年份:

    未知

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    KLA 2135
    KLA2135Defect Inspection
    年份: 0状况: 翻新
    上次验证60 多天前

    KLA

    2135

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    listing-photo-aa147c16af764420b0c7b668a25c1d72-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    89654


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    MS-DOS
    OEM 型号描述
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    文件

    无文件

    类似上架物品
    查看全部
    KLA 2135
    KLA
    2135
    Defect Inspection年份: 0状况: 翻新上次验证: 60 多天前
    KLA 2135
    KLA
    2135
    Defect Inspection年份: 0状况: 二手上次验证: 60 多天前