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KLA SURFSCAN SP2
    说明
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    配置
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    OEM 型号描述
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
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    KLA

    SURFSCAN SP2

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    已验证

    类别

    Defect Inspection
    上次验证: 18 天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    92347


    晶圆尺寸:

    未知


    年份:

    未知

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    KLA SURFSCAN SP2
    KLASURFSCAN SP2Defect Inspection
    年份: 0状况: 二手
    上次验证18 天前

    KLA

    SURFSCAN SP2

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 18 天前
    listing-photo-19ba577fc33d45fdab6429a0fac4b505-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    92347


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
    文件

    无文件

    类似上架物品
    查看全部
    KLA SURFSCAN SP2
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    Defect Inspection年份: 0状况: 翻新上次验证: 30 多天前