说明
无说明配置
Thickness MeasurementOEM 型号描述
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.文件
无文件
类别
Elipsometry
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103869
晶圆尺寸：
8"/200mm
年份：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ONTO / RUDOLPH / AUGUST
FOCUS FE VII
类别
Elipsometry
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
103869
晶圆尺寸：
8"/200mm
年份：
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Thickness MeasurementOEM 型号描述
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.文件
无文件