
说明
无说明配置
无配置OEM 型号描述
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文件
无文件
类别
Metrology
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
Deinstalled
产品编号:
128999
晶圆尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
SpectraShape 9000
类别
Metrology
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
Deinstalled
产品编号:
128999
晶圆尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文件
无文件