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KLA SpectraShape 9000
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.
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    verified-listing-icon

    已验证

    类别
    Metrology

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    129006


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA SpectraShape 9000

    KLA

    SpectraShape 9000

    Metrology
    年份: 0状况: 二手
    上次验证30 多天前

    KLA

    SpectraShape 9000

    verified-listing-icon
    已验证
    类别
    Metrology
    上次验证: 60 多天前
    listing-photo-6a74593f5b4a49c4a26a700357062ebe-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    129006


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.
    文件

    无文件

    类似上架物品
    查看全部
    KLA SpectraShape 9000

    KLA

    SpectraShape 9000

    Metrology年份: 0状况: 二手上次验证:30 多天前
    KLA SpectraShape 9000

    KLA

    SpectraShape 9000

    Metrology年份: 0状况: 二手上次验证:30 多天前
    KLA SpectraShape 9000

    KLA

    SpectraShape 9000

    Metrology年份: 0状况: 二手上次验证:30 多天前