说明
无说明配置
10-3KLA_A600_IBOREG_01OEM 型号描述
To help achieve sub-3nm overlay error for advanced logic and memory devices KLA introduced the Archer 600 imaging-based overlay metrology system. New optics in combination with innovative ProAIM targets deliver better resilience to process variations and improved correlation between measurement target and actual device pattern overlay errors, producing more accurate overlay measurements.文件
无文件
类别
Overlay
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
149557
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
ARCHER 600
类别
Overlay
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
149557
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
10-3KLA_A600_IBOREG_01OEM 型号描述
To help achieve sub-3nm overlay error for advanced logic and memory devices KLA introduced the Archer 600 imaging-based overlay metrology system. New optics in combination with innovative ProAIM targets deliver better resilience to process variations and improved correlation between measurement target and actual device pattern overlay errors, producing more accurate overlay measurements.文件
无文件