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说明
无说明配置
无配置OEM 型号描述
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文件
无文件
PREFERRED
SELLER
类别
Overlay
上次验证： 15 天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
128990
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
SELLER
ZEISS / CARL ZEISS
PROVE
类别
Overlay
上次验证： 15 天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
128990
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文件
无文件