说明
REGISTRATION & OPTICAL CD配置
无配置OEM 型号描述
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文件
无文件
类别
Overlay
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
73742
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
PROVE
类别
Overlay
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
73742
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
REGISTRATION & OPTICAL CD配置
无配置OEM 型号描述
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文件
无文件