说明
Four Point Probe Feature: Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static, 0.1% dynamic Repeatability Measurement unit size: 12”W x 10”H x 18”D配置
无配置OEM 型号描述
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).文件
无文件
类别
Resistivity / Four Point Probe
上次验证： 4 天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
138655
晶圆尺寸：
2"/50mm, 8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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CDE
ResMap 178
类别
Resistivity / Four Point Probe
上次验证： 4 天前
物品主要详细信息
状况：
Refurbished
运行状况:
未知
产品编号：
138655
晶圆尺寸：
2"/50mm, 8"/200mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Four Point Probe Feature: Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange 1mΩ/☐ to 10MΩ/☐ Accuracy 0.5% Repeatability 0.02% static, 0.1% dynamic Repeatability Measurement unit size: 12”W x 10”H x 18”D配置
无配置OEM 型号描述
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).文件
无文件