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说明
无说明配置
ResMap Four Point Probe, 2”-8” Manual loadOEM 型号描述
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).文件
无文件
类别
Resistivity / Four Point Probe
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
68124
晶圆尺寸：
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CDE
ResMap 178
类别
Resistivity / Four Point Probe
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
68124
晶圆尺寸：
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
ResMap Four Point Probe, 2”-8” Manual loadOEM 型号描述
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).文件
无文件