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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400
  • THERMOFISHER SCIENTIFIC / FEI / PHILLIPS STRATA 400
说明
spare parts.
配置
无配置
OEM 型号描述
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
文件

无文件

PREFERRED
 
SELLER
类别
SEM / FIB

上次验证: 60 多天前

Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Parts Tool


运行状况:

未知


产品编号:

104220


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

STRATA 400

verified-listing-icon
已验证
类别
SEM / FIB
上次验证: 60 多天前
listing-photo-73930c4ac5944b01828e9673942b4775-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
物品主要详细信息

状况:

Parts Tool


运行状况:

未知


产品编号:

104220


晶圆尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
spare parts.
配置
无配置
OEM 型号描述
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
文件

无文件