说明
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller available配置
无配置OEM 型号描述
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.文件
无文件
类别
SEM / FIB
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
146759
晶圆尺寸：
未知
年份：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
STRATA 400
类别
SEM / FIB
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
146759
晶圆尺寸：
未知
年份：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller available配置
无配置OEM 型号描述
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.文件
无文件