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JEOL JSM-6490LV
    说明
    Scanning Electron Microscope (SEM)
    配置
    无配置
    OEM 型号描述
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
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    JEOL

    JSM-6490LV

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    97745


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM
    年份: 0状况: 二手
    上次验证60 多天前

    JEOL

    JSM-6490LV

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 60 多天前
    listing-photo-2832b74909f04de6b73dadbfeaf9136e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    97745


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Scanning Electron Microscope (SEM)
    配置
    无配置
    OEM 型号描述
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    文件

    无文件

    类似上架物品
    查看全部
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM年份: 0状况: 二手上次验证:60 多天前
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM年份: 0状况: 二手上次验证:60 多天前