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JEOL JSM-6490LV
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
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    JEOL

    JSM-6490LV

    verified-listing-icon

    已验证

    类别
    SEM

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    63964


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
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    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM
    年份: 0状况: 二手
    上次验证60 多天前

    JEOL

    JSM-6490LV

    verified-listing-icon
    已验证
    类别
    SEM
    上次验证: 60 多天前
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/848dd5f90dc746d497f7b65164615079_img2481_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/84cd808aaf4b4f7189833c6a76a2c2f9_img2483_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/304314a4dc32416eb4833ff6a308439f_img2484_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/04be449eef16463fb77d90d3f91c80db_img2486_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/fee8ebdec60f4f2a92f5fdcef9cc3db4_img2487_mw.jpg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    63964


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    文件

    无文件

    类似上架物品
    查看全部
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM年份: 0状况: 二手上次验证:60 多天前
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM年份: 0状况: 二手上次验证:60 多天前