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KLA CANDELA CS10
    说明
    Optical Defect Inspection
    配置
    无配置
    OEM 型号描述
    The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.
    文件

    无文件

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115143


    晶圆尺寸:

    4"/100mm


    年份:

    2009


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA

    CANDELA CS10

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/b7d9b83c91614b3c876b81a582bfea5c_spk3600_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/07bf1bac6aa645f89106c0822e5b58bd_spk3601copy_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/eb7a473bc6934b149a9751e6678797e1_spk3602_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/c2d6e48378c04e3cb3011e9a2f185612_spk3601_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/12036f49f6354b8ba33bb845743bd1ed_spk3602copy_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/48cdf54187674593aabf1d95cebe7db5_spk3603_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/c32155243deb48668a0bae8a9e7afc22_spk3604_mw.jpeg
    listing-photo-71bf893fd3034c85856c26e848f310d3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/71bf893fd3034c85856c26e848f310d3/10f59c9b0efc49f4b4be5a62092d92e9_spk3605_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    115143


    晶圆尺寸:

    4"/100mm


    年份:

    2009


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Optical Defect Inspection
    配置
    无配置
    OEM 型号描述
    The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.
    文件

    无文件